Acronyms in microscopy 4764420 205137945 2008-04-12T15:29:19Z Jmameren 4632991 /* Abbreviations */ {{Merge|list of materials analysis methods|date=January 2008}} This list is outdated. Technological status of 1997. ==Abbreviations== *AAS Atomic Absorption Spectroscopy *ACF absorption correction factor *ADC analog to digital converter *AED Atomic Emission Detector *AEM analytical electron microscope/microscopy *AES Atomic Emission Spectroscopy *AES Auger electron spectroscopy *AFM atomic force microscopy *AFS Atomic Fluorescence Spectroscopy *APSTM Analytical Photon Scanning Tunneling Microscope *ATW atmospheric thin window *BSE backscattered electron *BSED backscattered electron diffraction *BSEI backscattered electron image/imaging *CB coherent bremsstrahlung *CBIM convergent-beam imaging *CCD charge-coupled device *CFEG cold field-emission gun *CL condenser lens *CL cathodoluminescence *CRT cathode-ray tube *CS [[counter-scanning]] *CSI [[counter-scanned images]] *CTEM Conventional Transmission Electron Microscopy *DP Diffraction Pattern *DSTEM dedicated scanning transmission electron microscopy *EBIC [[electron beam-induced current]] *EBSD [[electron backscatter diffraction]] *ECD Electron Capture Detector *EDAX Energy Dispersive Analysis of X-rays *EDS [[Energy Dispersive X-ray Spectroscopy]] *EDX [[Energy Dispersive X-ray Analysis]] *EDXF Enery Dispersive X-ray Fluorescence *EELS [[electron energy-loss spectrometry]]/spectroscopy *EFM Electro-Force Microscopy *EFTEM [[energy filtering transmission electron microscope]] *EI Electron Impact *EM [[Electron Microscopy]] *EMMA electron microscope microanalyzer *EMP [[electron microprobe]] *EMPA electron microprobe analysis *EMS electron microscopy image simulation *EPASA Electron Probe Analysis Society of America *EPMA electron probe microanalyzer *EPMA [[Electron microprobe|electron probe micro analysis]] *EPMA [[Electron microprobe|electron probe microanalysis]] *ESCA electron spectroscopy for chemical analysis *ESD Electron Stimulated Desorption *ESEM [[Environmental Scanning Electron Microscopy]] *ESI [[electron spectroscopic imaging]] *ESR Electron Spin Resonance *FA Fluorescence Analysis *FCF fluorescence correction factor *FEG [[field emission]] gun *FEM Field Emission Electron Microscopy *FET field effect transistor *FFEM Freeze-Fracture Electron Microscopy *FFT [[fast Fourier transform]] *FIM field ion microscopy *FOS [[feature-oriented scanning]] *FOSPM [[feature-oriented scanning probe microscopy]] *FSE fast secondary electron *FWHM full width at half maximum *FWTM full width at tenth maximum *GB grain boundary *GCS generalized cross section *HPGe high purity Germanium detector *HAADF high angle [[annular_dark-field_imaging|annular darkfield imaging]] *HREM [[high resolution electron microscope]] *HRTEM [[High-resolution transmission electron microscopy]] *HV high vacuum *HVEM high voltage electron microscope/microscopy *ICP Inductively Coupled Plasma *IR infrared spectroscopy *IVEM intermediate voltage electron microscope/microscopy *JEOL Japanese Electron Optics Laboratory *KAP potassium acid phthalate *LDE1 Layered Dispertion Element 1 *LDE2 Layered Dispertion Element 2 *LEED low-energy electron diffraction *LEEM [[Low-energy electron microscopy]] *LIF Lithium Fluoride *LM light microscopy *LOD Limit Of Detection *MAC mass absorption coefficient *MAS Microbeam Analysis Society *MCA multichannel analyzer *MDM minimum detectable mass *MEEM Metastable Electron Emission Microscopy *MEM Mirror Electron Microscopy *MFM Magnetic Force Microscopy *MLS multiple least squares fit *MMF minimum mass fraction *MS Mass Spectroscopy *MTXM Magnetic Transmission X-ray Microscopy *NAA Neutron Activation Analysis *NIST [[National Institute of Standards and Technology]] *nm [[nanometer]] *NMR Nuclear Magnetic Resonance *NPD Nitrogen-Phosphorus Detector *OBHIC Optical Beam Heat Induced Current *OBIC Optical Beam Induced Current *OBIRCH Optical Beam Induced Resistance Change *OES Optical Emission Spectroscopy *P/B peak-to-background ratio *PAP Pouchou and Pichoir *PB phase boundary *PB Particle Beam *PEELS parallel electron energy-loss spectroscopy *PEEM Photoemission Electron Microscopy *PES Photoelectron Spectroscopy *PET Pentaerythritol *PLI Photoluminescence Imaging *PMT photomultiplier tube *PTMS photothermal microspectroscopy *ppb parts per billion *ppm parts per million *QE quantum efficiency *RAP rubidum acid phthalate ratemeter *REM reflection electron microscope/microscopy *RESOXS Resonant Soft X-ray Scattering *RHEED [[reflection high-energy electron diffraction]] *S/N signal-to-noise ratio *SAD [[selected-area diffraction]] *SAED selected area electron diffraction *SAM scanning Auger microscopy/microprobe *SAXS Small-Angle X-ray Scattering *SCL Spectrally Resolved Cathodoluminescence *SE secondary electron *SEELS serial electron energy-loss spectrometer/spectrometry *SEM scanning electron microscope/microscopy *SESM scanning electron spectrometric spectroscopy *Si(Li) Lithium drifted silicon *SIMS secondary ion mass spectrometry/spectroscopy *SPEEM Scanning Photoemission Electron Microscopy *SPELEEM Spectroscopic Photoemission and Low Energy Electron Microscopy *SPEM [[Scanning Photoelectron Microscopy]] *SPM [[Scanning probe microscopy]] *SRM standard reference material *STEM [[scanning transmission electron microscope]]/microscopy *STM [[scanning tunneling microscope]]/microscopy *STS [[Scanning Tunneling Spectroscopy]] *STXM Scanning Transmission X-ray Microscopy *TAP Thallium Acid Phthalate *TB twin boundary *TED Transmission Electron Diffraction *TED Thermionic Emission Detector *TEM [[transmission electron microscope]]/microscopy *TIRF [[Total internal reflection fluorescence microscope]]/microscopy *TLE Thin Layer Electrode *TOF-MS Time-Of-Flight Mass Spectrometry *TXM Transmission X-ray Microscopy *UHV ultrahigh vacuum *UTW ultra thin window *VDIC voltage distribution contrast *VLM visible-light microscope/microscopy *WDS wavelength-dispersive *WDX wavelength dispersive X-ray spectroscopy *XANES X-ray absorption near-edge spectroscopy *XANES X-ray absorption near-edge structure *XEDS X-ray energy-dispersive *XPEEM X-ray Photoemission Electron Microscopy *XPLEEM X-ray Photoemission and Low Energy Electron Microscopy *XPS X-ray photoelectron spectroscopy *XRD X-ray diffraction *XRF X-ray Fluorescence *ZAF atomic number, absorption, fluorescence correction == See also == *[[Failure analysis]] {{listdev}} [[Category:Science-related lists|Microscopy]] [[Category:Microscopy]]