Acronyms in microscopy
4764420
205137945
2008-04-12T15:29:19Z
Jmameren
4632991
/* Abbreviations */
{{Merge|list of materials analysis methods|date=January 2008}}
This list is outdated. Technological status of 1997.
==Abbreviations==
*AAS Atomic Absorption Spectroscopy
*ACF absorption correction factor
*ADC analog to digital converter
*AED Atomic Emission Detector
*AEM analytical electron microscope/microscopy
*AES Atomic Emission Spectroscopy
*AES Auger electron spectroscopy
*AFM atomic force microscopy
*AFS Atomic Fluorescence Spectroscopy
*APSTM Analytical Photon Scanning Tunneling Microscope
*ATW atmospheric thin window
*BSE backscattered electron
*BSED backscattered electron diffraction
*BSEI backscattered electron image/imaging
*CB coherent bremsstrahlung
*CBIM convergent-beam imaging
*CCD charge-coupled device
*CFEG cold field-emission gun
*CL condenser lens
*CL cathodoluminescence
*CRT cathode-ray tube
*CS [[counter-scanning]]
*CSI [[counter-scanned images]]
*CTEM Conventional Transmission Electron Microscopy
*DP Diffraction Pattern
*DSTEM dedicated scanning transmission electron microscopy
*EBIC [[electron beam-induced current]]
*EBSD [[electron backscatter diffraction]]
*ECD Electron Capture Detector
*EDAX Energy Dispersive Analysis of X-rays
*EDS [[Energy Dispersive X-ray Spectroscopy]]
*EDX [[Energy Dispersive X-ray Analysis]]
*EDXF Enery Dispersive X-ray Fluorescence
*EELS [[electron energy-loss spectrometry]]/spectroscopy
*EFM Electro-Force Microscopy
*EFTEM [[energy filtering transmission electron microscope]]
*EI Electron Impact
*EM [[Electron Microscopy]]
*EMMA electron microscope microanalyzer
*EMP [[electron microprobe]]
*EMPA electron microprobe analysis
*EMS electron microscopy image simulation
*EPASA Electron Probe Analysis Society of America
*EPMA electron probe microanalyzer
*EPMA [[Electron microprobe|electron probe micro analysis]]
*EPMA [[Electron microprobe|electron probe microanalysis]]
*ESCA electron spectroscopy for chemical analysis
*ESD Electron Stimulated Desorption
*ESEM [[Environmental Scanning Electron Microscopy]]
*ESI [[electron spectroscopic imaging]]
*ESR Electron Spin Resonance
*FA Fluorescence Analysis
*FCF fluorescence correction factor
*FEG [[field emission]] gun
*FEM Field Emission Electron Microscopy
*FET field effect transistor
*FFEM Freeze-Fracture Electron Microscopy
*FFT [[fast Fourier transform]]
*FIM field ion microscopy
*FOS [[feature-oriented scanning]]
*FOSPM [[feature-oriented scanning probe microscopy]]
*FSE fast secondary electron
*FWHM full width at half maximum
*FWTM full width at tenth maximum
*GB grain boundary
*GCS generalized cross section
*HPGe high purity Germanium detector
*HAADF high angle [[annular_dark-field_imaging|annular darkfield imaging]]
*HREM [[high resolution electron microscope]]
*HRTEM [[High-resolution transmission electron microscopy]]
*HV high vacuum
*HVEM high voltage electron microscope/microscopy
*ICP Inductively Coupled Plasma
*IR infrared spectroscopy
*IVEM intermediate voltage electron microscope/microscopy
*JEOL Japanese Electron Optics Laboratory
*KAP potassium acid phthalate
*LDE1 Layered Dispertion Element 1
*LDE2 Layered Dispertion Element 2
*LEED low-energy electron diffraction
*LEEM [[Low-energy electron microscopy]]
*LIF Lithium Fluoride
*LM light microscopy
*LOD Limit Of Detection
*MAC mass absorption coefficient
*MAS Microbeam Analysis Society
*MCA multichannel analyzer
*MDM minimum detectable mass
*MEEM Metastable Electron Emission Microscopy
*MEM Mirror Electron Microscopy
*MFM Magnetic Force Microscopy
*MLS multiple least squares fit
*MMF minimum mass fraction
*MS Mass Spectroscopy
*MTXM Magnetic Transmission X-ray Microscopy
*NAA Neutron Activation Analysis
*NIST [[National Institute of Standards and Technology]]
*nm [[nanometer]]
*NMR Nuclear Magnetic Resonance
*NPD Nitrogen-Phosphorus Detector
*OBHIC Optical Beam Heat Induced Current
*OBIC Optical Beam Induced Current
*OBIRCH Optical Beam Induced Resistance Change
*OES Optical Emission Spectroscopy
*P/B peak-to-background ratio
*PAP Pouchou and Pichoir
*PB phase boundary
*PB Particle Beam
*PEELS parallel electron energy-loss spectroscopy
*PEEM Photoemission Electron Microscopy
*PES Photoelectron Spectroscopy
*PET Pentaerythritol
*PLI Photoluminescence Imaging
*PMT photomultiplier tube
*PTMS photothermal microspectroscopy
*ppb parts per billion
*ppm parts per million
*QE quantum efficiency
*RAP rubidum acid phthalate ratemeter
*REM reflection electron microscope/microscopy
*RESOXS Resonant Soft X-ray Scattering
*RHEED [[reflection high-energy electron diffraction]]
*S/N signal-to-noise ratio
*SAD [[selected-area diffraction]]
*SAED selected area electron diffraction
*SAM scanning Auger microscopy/microprobe
*SAXS Small-Angle X-ray Scattering
*SCL Spectrally Resolved Cathodoluminescence
*SE secondary electron
*SEELS serial electron energy-loss spectrometer/spectrometry
*SEM scanning electron microscope/microscopy
*SESM scanning electron spectrometric spectroscopy
*Si(Li) Lithium drifted silicon
*SIMS secondary ion mass spectrometry/spectroscopy
*SPEEM Scanning Photoemission Electron Microscopy
*SPELEEM Spectroscopic Photoemission and Low Energy Electron Microscopy
*SPEM [[Scanning Photoelectron Microscopy]]
*SPM [[Scanning probe microscopy]]
*SRM standard reference material
*STEM [[scanning transmission electron microscope]]/microscopy
*STM [[scanning tunneling microscope]]/microscopy
*STS [[Scanning Tunneling Spectroscopy]]
*STXM Scanning Transmission X-ray Microscopy
*TAP Thallium Acid Phthalate
*TB twin boundary
*TED Transmission Electron Diffraction
*TED Thermionic Emission Detector
*TEM [[transmission electron microscope]]/microscopy
*TIRF [[Total internal reflection fluorescence microscope]]/microscopy
*TLE Thin Layer Electrode
*TOF-MS Time-Of-Flight Mass Spectrometry
*TXM Transmission X-ray Microscopy
*UHV ultrahigh vacuum
*UTW ultra thin window
*VDIC voltage distribution contrast
*VLM visible-light microscope/microscopy
*WDS wavelength-dispersive
*WDX wavelength dispersive X-ray spectroscopy
*XANES X-ray absorption near-edge spectroscopy
*XANES X-ray absorption near-edge structure
*XEDS X-ray energy-dispersive
*XPEEM X-ray Photoemission Electron Microscopy
*XPLEEM X-ray Photoemission and Low Energy Electron Microscopy
*XPS X-ray photoelectron spectroscopy
*XRD X-ray diffraction
*XRF X-ray Fluorescence
*ZAF atomic number, absorption, fluorescence correction
== See also ==
*[[Failure analysis]]
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[[Category:Science-related lists|Microscopy]]
[[Category:Microscopy]]