List of materials analysis methods 1917699 205811041 2008-04-15T16:05:17Z Hubble618 3271000 /* C */ List of materials analysis methods: {{CompactTOC2}} *'''μSR''' - [[Muon spin spectroscopy]] *'''χ''' - [[Magnetic susceptibility|Magnetic susceptibility measurements]] ==A== *'''Analytical ultracentrifugation''' - [[Analytical ultracentrifugation]] *'''AAS''' - [[Atomic absorption spectroscopy]] *'''AED''' - [[Auger electron diffraction]] *'''AES''' - [[Auger electron spectroscopy]] *'''AFM''' - [[Atomic force microscope]] *'''APFIM''' - [[Atom Probe|Atom probe field ion microscopy]] *'''APS''' - [[Appearance potential spectroscopy]] *'''ATR''' - [[Attenuated total reflectance]] *'''AXRS''' - [[Anomalous X-ray scattering]] ==B== *'''BET''' - [[BET theory|BET surface area measurement]] *'''BKD''' - Backscatter Kikuchi diffraction, see '''EBSD''' *'''BiFC''' - [[Bimolecular fluorescence complementation]] *'''BRET''' - [[Bioluminescence resonance energy transfer]] *'''BSE''' - [[Back scattered electron]] *'''BSED''' - Back scattered electron diffraction, see '''EBSD''' ==C== *'''CAICISS''' - [[Coaxial impact collision ion scattering spectroscopy]] *'''CBED''' - [[Convergent beam electron diffraction]] *'''CET''' - [[Cryo-electron tomography]] *'''CCM''' - [[Charge collection microscopy]] *'''CL''' - [[Cathodoluminescence]] *'''CLSM''' - [[Confocal laser scanning microscopy]] *'''CDI''' - [[Coherent diffraction imaging]] *'''COSY''' - [[Correlation spectroscopy]] *'''Cryo-EM''' - [[Cryo-electron microscopy]] *'''CV''' - [[Cyclic voltammetry]] ==D== *'''DE(T)A''' - [[Dielectric thermal analysis]] *'''dHvA''' - [[De Haas-van Alphen effect]] *'''Dielectric spectroscopy''' - [[Dielectric spectroscopy]] *'''DIC''' - [[Differential interference contrast microscopy]] *'''DLS''' - [[Dynamic light scattering]] *'''DMA''' - [[Dynamic mechanical analysis]] *'''DSC''' - [[Differential scanning calorimetry]] *'''DVS''' - [[Dynamic vapour sorption]] ==E== *'''EBIC''' - [[Electron beam induced current]] *'''EBSD''' - [[Electron backscatter diffraction]] *'''ECOSY''' - [[Exclusive correlation spectroscopy]] *'''ECT''' - [[Electrical capacitance tomography]] *'''EDX''' - [[Energy dispersive X-ray spectroscopy]] *'''EELS''' - [[Electron energy loss spectroscopy]] *'''EFTEM''' - [[Energy filtered transmission electron microscopy]] *'''EID''' - [[Electron induced desorption]] *'''EIT''' and '''ERT''' - [[Electrical impedance tomography]] and [[Electrical resistivity tomography]] *'''Electron crystallography''' - [[Electron crystallography]] *'''ELS''' - [[Electrophoretic light scattering]] *'''EPMA''' - [[Electron microprobe|Electron probe microanalysis]] *'''ESEM''' - [[Scanning_electron_microscope#Environmental_SEM|Environmental scanning electron microscopy]] *'''ESCA''' - [[ESCA|Electron spectroscopy for chemical analysis]]*''' see XPS *'''ESI-MS''' or '''ES-MS''' - [[Electrospray ionization|Electrospray ionization mass spectrometry]] or Electrospray mass spectrometry *'''ESTM''' - [[Electrochemical scanning tunneling microscope]] *'''EPR''' - [[Electron paramagnetic resonance|Electron paramagnetic resonance spectroscopy]] *'''ESD''' - [[Electron stimulated desorption]] *'''ESR''' - [[Electron paramagnetic resonance|Electron spin resonance spectroscopy]] *'''EXAFS''' - [[Extended X-ray absorption fine structure]] *'''EXSY''' - [[Exchange spectroscopy]] ==F== *'''FCS''' - [[Fluorescence correlation spectroscopy]] *'''FCCS''' - [[Fluorescence cross-correlation spectroscopy]] *'''FEM''' - [[Field emission microscope|Field emission microscopy]] *'''FIB''' - [[Focused ion beam]] microscopy *'''FIM-AP''' - [[Field ion microscopy]]–[[atom probe]] *'''Flow birefringence''' - [[Flow birefringence]] *'''Fluorescence anisotropy''' - [[Fluorescence anisotropy]] *'''FLIM''' - [[Fluorescence lifetime imaging]] *'''Fluorescence microscopy''' - [[Fluorescence microscopy]] *'''FRET''' - [[Fluorescence resonance energy transfer]] *'''FTICR''' or '''FT-MS''' - [[Fourier transform ion cyclotron resonance]] or Fourier transform mass spectrometry *'''FTIR''' - [[Fourier transform spectroscopy|Fourier transform infrared absorption spectroscopy]] ==G== *'''GC-MS''' - [[Gas chromatography-mass spectrometry]] *'''GDMS''' - [[Glow discharge mass spectrometry]] *'''GDOS''' - [[Glow discharge optical spectroscopy]] *'''GISAXS ''' - [[Grazing incidence small angle X-ray scattering]] *'''GIXD''' - [[Grazing incidence X-ray diffraction]] *'''GIXR''' - [[Grazing incidence X-ray reflectivity]] *'''GLC''' - [[Gas-liquid chromatography]] ==H== *'''HAS''' - [[Helium atom scattering]] *'''HPLC''' - [[High performance liquid chromatography]] *'''HREELS''' - [[High resolution electron energy loss spectroscopy]] *'''HRTEM ''' - [[High-resolution transmission electron microscopy]] ==I== *'''IAES''' - [[Ion induced Auger electron spectroscopy]] *'''IBIC''' - [[Ion beam induced charge]] microscopy *'''ICP-MS''' - [[Inductively coupled plasma mass spectrometry]] *'''Immunofluorescence''' - [[Immunofluorescence]] *'''ICR''' - [[Ion cyclotron resonance]] *'''IETS''' - [[Inelastic electron tunneling spectroscopy]] *'''IGA''' - [[Intelligent gravimetric analysis]] *'''IIX''' - [[Ion induced X-ray analysis]] *'''INS''' - [[Ion neutralization spectroscopy]]<br>[[Inelastic neutron scattering]] *'''IRS''' - [[Infrared spectroscopy]] *'''ISS''' - [[low-energy ion scattering|Ion scattering spectroscopy]] *'''ITC''' - [[Isothermal titration calorimetry]] *'''IVEM''' - [[Intermediate voltage electron microscopy]] ==L== * [[List of materials analysis methods]] (deliberate self-link) *'''LALLS''' - [[Low-angle laser light scattering]] *'''LC-MS''' - [[Liquid chromatography-mass spectrometry]] *'''LEED''' - [[Low-energy electron diffraction]] *'''LEEM''' - [[Low-energy electron microscopy]] *'''LEIS''' - [[Low-energy ion scattering]] *'''LIBS''' - [[Laser induced breakdown spectroscopy]] *'''LOES''' - [[Laser optical emission spectroscopy]] *'''LS''' - [[Raman scattering|Light (Raman) scattering]] ==M== *'''MALDI''' - [[Matrix-assisted laser desorption/ionization]] *'''MIT''' - [[Magnetic induction tomography]] *'''MRFM''' - [[Magnetic resonance force microscopy]] *'''MRI''' - [[Magnetic resonance imaging]] *'''MS''' - [[Mass spectrometry]] *'''MS/MS''' - [[Tandem mass spectrometry]] *'''MEIS''' - [[Medium energy ion scattering]] *'''Mössbauer spectroscopy''' - [[Mössbauer spectroscopy]] *'''MTA''' - [[Microthermal analysis]] ==N== *'''Nanovid microscopy''' - [[Nanovid microscopy]] *'''ND''' - [[Neutron diffraction]] *'''NDP''' - [[Neutron depth profiling]] *'''NAA''' - [[Neutron activation analysis]] *'''NEXAFS''' - [[NEXAFS|Near edge X-ray absorption fine structure]] *'''NMR''' - [[NMR spectroscopy|Nuclear magnetic resonance spectroscopy]] *'''NOESY''' - [[NOESY|Nuclear Overhauser effect spectroscopy]] *'''NSOM''' - [[Near-field scanning optical microscope|Near-field optical microscope]] ==O== *'''OES''' - [[Emission spectroscopy|Optical emission spectroscopy]] *'''Osmometry''' - [[Osmometry]] ==P== *'''PAS''' - [[Positron annihilation spectroscopy]] *'''PAT''' or '''PACT''' - [[Photoacoustic tomography]] or photoacoustic computed tomography *'''PAX''' - [[Photoemission of adsorbed xenon]] *'''PC or PCS''' - [[Photocurrent spectroscopy]] *'''PD''' - [[Photodesorption]] *'''PDEIS''' - [[Potentiodynamic electrochemical impedance spectroscopy]] *'''PED''' - [[Photoelectron diffraction]] *'''Porosimetry''' - [[Porosimetry]] *'''Phase contrast microscopy''' - [[Phase contrast microscopy]] *'''PIXE''' - [[PIXE|Particle (or proton) induced X-ray spectroscopy]] *'''Powder diffraction''' - [[Powder diffraction]] *'''PTMS''' - [[Photothermal microspectroscopy]] ==Q== *'''QENS''' - [[Quasi-elastic neutron scattering]] ==R== *'''Raman''' - [[Raman spectroscopy]] *'''RAXRS''' - [[Resonant anomalous X-ray scattering]] *'''RBS''' - [[Rutherford backscattering|Rutherford backscattering spectroscopy]] *'''REM''' - [[Reflection electron microscopy]] *'''RHEED''' - [[RHEED|Reflection high energy electron diffraction]] *'''RR spectroscopy''' - [[Resonance Raman spectroscopy]] ==S== *'''SAM''' - [[Scanning Auger microscopy]] *'''SANS''' - [[Small angle neutron scattering]] *'''SAXS ''' - [[SAXS|Small angle X-ray scattering]] *'''SCANIIR''' - [[Surface composition by analysis of neutral species and ion-impact radiation]] *'''SE''' - [[Ellipsometry|Spectroscopic ellipsometry]] *'''SEC''' - [[Size exclusion chromatography]] *'''SEIRA''' - [[Surface enhanced infrared absorption spectroscopy]] *'''SEM''' - [[Scanning electron microscope|Scanning electron microscopy]] *'''SERS''' - [[Surface enhanced Raman spectroscopy]] *'''SEXAFS''' - [[Surface extended X-ray absorption fine structure]] *'''SICM''' - [[Scanning ion-conductance microscopy]] *'''SIMS''' - [[Secondary ion mass spectrometry]] *'''SNMS''' - [[Sputtered neutral species mass spectroscopy]] *'''SNOM''' - [[Scanning near-field optical microscopy]] *'''SPECT''' - [[Single photon emission computed tomography]] *'''SPM''' - [[Scanning probe microscopy]] *'''SRM-CE/MS''' - Selected-reaction-monitoring [[capillary electrophoresis|capillary-electrophoresis]] [[Liquid chromatography-mass spectrometry|mass-spectrometry]] *'''SSNMR''' - [[Solid-state nuclear magnetic resonance]] *'''Stark spectroscopy''' - [[Stark effect|Stark spectroscopy]] *'''STEM''' - [[Scanning transmission electron microscopy]] *'''STM''' - [[Scanning tunneling microscopy]] ==T== *'''TEM''' - [[Transmission electron microscopy]] *'''TAT''' or '''TACT''' - [[Thermoacoustic tomography]] or thermoacoustic computed tomography (see also [[photoacoustic tomography]] - PAT) *'''TGA''' - [[Thermogravimetric analysis]] *'''TIRFM''' - [[Total internal reflection fluorescence microscopy]] *'''TMA''' - [[Thermomechanical analysis]] *'''TXRF''' - Total reflection [[X-ray fluorescence]] analysis *'''Two-photon excitation microscopy''' - [[Two-photon excitation microscopy]] ==U== *'''Ultrasound attenuation spectroscopy''' - [[Ultrasound attenuation spectroscopy]] *'''Ultrasonic testing''' - [[Ultrasonic testing]] *'''UPS''' - [[Ultraviolet-visible spectroscopy|UV-photoelectron spectroscopy]] ==V== *'''VEDIC''' - Video-enhanced [[differential interference contrast microscopy]] *'''Voltammetry''' - [[Voltammetry]] ==W== *'''WAXS ''' - [[Wide angle X-ray scattering]] *'''WDXRF or WDS''' - [[Wavelength dispersive X-ray spectroscopy]] ==X== *'''XAES''' - [[X-ray induced Auger electron spectroscopy]] *'''XANES''' - [[XANES]], synonymous with [[Near edge X-ray absorption fine structure|NEXAFS (Near edge X-ray absorption fine structure)]] *'''XAS''' - [[X-ray absorption spectroscopy]] *'''X-CTR''' - [[X-ray crystal truncation rod]] scattering *'''X-ray crystallography''' - [[X-ray crystallography]] *'''XDS''' - [[X-ray diffuse scattering]] *'''XPEEM''' - [[X-ray photoelectron emission microscopy]] *'''XPS''' - [[X-ray photoelectron spectroscopy]] *'''XR''' - [[X-ray reflectivity]] *'''XRD''' - [[X-ray diffraction]] *'''XRF''' - [[X-ray fluorescence]] analysis *'''XSW''' - [[X-ray standing waves|X-ray standing wave]] technique ==References== *{{cite book | author=Callister, WD | title=Materials Science and Engineering - An Introduction | publisher=''[[John Wiley and Sons]]'' : London | year=2000 | isbn=0-471-32013-7}} *{{cite book | editor=Yao, N | title=Focused Ion Beam Systems: Basics and Applications | publisher=''[[Cambridge University Press]]'' : Cambridge, UK | year=2007 | isbn=978-052183-1994}} [[Category:Materials science|Materials analysis methods]] [[Category:Analytical chemistry]] [[Category:Science-related lists|Materials analysis methods]] [[Category:Topical indexes|Materials analysis methods]] [[Category:Scientific techniques|Materials analysis methods]] [[fa:فهرست روش‌های آنالیز مواد]] [[zh:材料分析方法列表]]