List of materials analysis methods
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205811041
2008-04-15T16:05:17Z
Hubble618
3271000
/* C */
List of materials analysis methods:
{{CompactTOC2}}
*'''μSR''' - [[Muon spin spectroscopy]]
*'''χ''' - [[Magnetic susceptibility|Magnetic susceptibility measurements]]
==A==
*'''Analytical ultracentrifugation''' - [[Analytical ultracentrifugation]]
*'''AAS''' - [[Atomic absorption spectroscopy]]
*'''AED''' - [[Auger electron diffraction]]
*'''AES''' - [[Auger electron spectroscopy]]
*'''AFM''' - [[Atomic force microscope]]
*'''APFIM''' - [[Atom Probe|Atom probe field ion microscopy]]
*'''APS''' - [[Appearance potential spectroscopy]]
*'''ATR''' - [[Attenuated total reflectance]]
*'''AXRS''' - [[Anomalous X-ray scattering]]
==B==
*'''BET''' - [[BET theory|BET surface area measurement]]
*'''BKD''' - Backscatter Kikuchi diffraction, see '''EBSD'''
*'''BiFC''' - [[Bimolecular fluorescence complementation]]
*'''BRET''' - [[Bioluminescence resonance energy transfer]]
*'''BSE''' - [[Back scattered electron]]
*'''BSED''' - Back scattered electron diffraction, see '''EBSD'''
==C==
*'''CAICISS''' - [[Coaxial impact collision ion scattering spectroscopy]]
*'''CBED''' - [[Convergent beam electron diffraction]]
*'''CET''' - [[Cryo-electron tomography]]
*'''CCM''' - [[Charge collection microscopy]]
*'''CL''' - [[Cathodoluminescence]]
*'''CLSM''' - [[Confocal laser scanning microscopy]]
*'''CDI''' - [[Coherent diffraction imaging]]
*'''COSY''' - [[Correlation spectroscopy]]
*'''Cryo-EM''' - [[Cryo-electron microscopy]]
*'''CV''' - [[Cyclic voltammetry]]
==D==
*'''DE(T)A''' - [[Dielectric thermal analysis]]
*'''dHvA''' - [[De Haas-van Alphen effect]]
*'''Dielectric spectroscopy''' - [[Dielectric spectroscopy]]
*'''DIC''' - [[Differential interference contrast microscopy]]
*'''DLS''' - [[Dynamic light scattering]]
*'''DMA''' - [[Dynamic mechanical analysis]]
*'''DSC''' - [[Differential scanning calorimetry]]
*'''DVS''' - [[Dynamic vapour sorption]]
==E==
*'''EBIC''' - [[Electron beam induced current]]
*'''EBSD''' - [[Electron backscatter diffraction]]
*'''ECOSY''' - [[Exclusive correlation spectroscopy]]
*'''ECT''' - [[Electrical capacitance tomography]]
*'''EDX''' - [[Energy dispersive X-ray spectroscopy]]
*'''EELS''' - [[Electron energy loss spectroscopy]]
*'''EFTEM''' - [[Energy filtered transmission electron microscopy]]
*'''EID''' - [[Electron induced desorption]]
*'''EIT''' and '''ERT''' - [[Electrical impedance tomography]] and [[Electrical resistivity tomography]]
*'''Electron crystallography''' - [[Electron crystallography]]
*'''ELS''' - [[Electrophoretic light scattering]]
*'''EPMA''' - [[Electron microprobe|Electron probe microanalysis]]
*'''ESEM''' - [[Scanning_electron_microscope#Environmental_SEM|Environmental scanning electron microscopy]]
*'''ESCA''' - [[ESCA|Electron spectroscopy for chemical analysis]]*''' see XPS
*'''ESI-MS''' or '''ES-MS''' - [[Electrospray ionization|Electrospray ionization mass spectrometry]] or Electrospray mass spectrometry
*'''ESTM''' - [[Electrochemical scanning tunneling microscope]]
*'''EPR''' - [[Electron paramagnetic resonance|Electron paramagnetic resonance spectroscopy]]
*'''ESD''' - [[Electron stimulated desorption]]
*'''ESR''' - [[Electron paramagnetic resonance|Electron spin resonance spectroscopy]]
*'''EXAFS''' - [[Extended X-ray absorption fine structure]]
*'''EXSY''' - [[Exchange spectroscopy]]
==F==
*'''FCS''' - [[Fluorescence correlation spectroscopy]]
*'''FCCS''' - [[Fluorescence cross-correlation spectroscopy]]
*'''FEM''' - [[Field emission microscope|Field emission microscopy]]
*'''FIB''' - [[Focused ion beam]] microscopy
*'''FIM-AP''' - [[Field ion microscopy]]–[[atom probe]]
*'''Flow birefringence''' - [[Flow birefringence]]
*'''Fluorescence anisotropy''' - [[Fluorescence anisotropy]]
*'''FLIM''' - [[Fluorescence lifetime imaging]]
*'''Fluorescence microscopy''' - [[Fluorescence microscopy]]
*'''FRET''' - [[Fluorescence resonance energy transfer]]
*'''FTICR''' or '''FT-MS''' - [[Fourier transform ion cyclotron resonance]] or Fourier transform mass spectrometry
*'''FTIR''' - [[Fourier transform spectroscopy|Fourier transform infrared absorption spectroscopy]]
==G==
*'''GC-MS''' - [[Gas chromatography-mass spectrometry]]
*'''GDMS''' - [[Glow discharge mass spectrometry]]
*'''GDOS''' - [[Glow discharge optical spectroscopy]]
*'''GISAXS ''' - [[Grazing incidence small angle X-ray scattering]]
*'''GIXD''' - [[Grazing incidence X-ray diffraction]]
*'''GIXR''' - [[Grazing incidence X-ray reflectivity]]
*'''GLC''' - [[Gas-liquid chromatography]]
==H==
*'''HAS''' - [[Helium atom scattering]]
*'''HPLC''' - [[High performance liquid chromatography]]
*'''HREELS''' - [[High resolution electron energy loss spectroscopy]]
*'''HRTEM ''' - [[High-resolution transmission electron microscopy]]
==I==
*'''IAES''' - [[Ion induced Auger electron spectroscopy]]
*'''IBIC''' - [[Ion beam induced charge]] microscopy
*'''ICP-MS''' - [[Inductively coupled plasma mass spectrometry]]
*'''Immunofluorescence''' - [[Immunofluorescence]]
*'''ICR''' - [[Ion cyclotron resonance]]
*'''IETS''' - [[Inelastic electron tunneling spectroscopy]]
*'''IGA''' - [[Intelligent gravimetric analysis]]
*'''IIX''' - [[Ion induced X-ray analysis]]
*'''INS''' - [[Ion neutralization spectroscopy]]<br>[[Inelastic neutron scattering]]
*'''IRS''' - [[Infrared spectroscopy]]
*'''ISS''' - [[low-energy ion scattering|Ion scattering spectroscopy]]
*'''ITC''' - [[Isothermal titration calorimetry]]
*'''IVEM''' - [[Intermediate voltage electron microscopy]]
==L==
* [[List of materials analysis methods]] (deliberate self-link)
*'''LALLS''' - [[Low-angle laser light scattering]]
*'''LC-MS''' - [[Liquid chromatography-mass spectrometry]]
*'''LEED''' - [[Low-energy electron diffraction]]
*'''LEEM''' - [[Low-energy electron microscopy]]
*'''LEIS''' - [[Low-energy ion scattering]]
*'''LIBS''' - [[Laser induced breakdown spectroscopy]]
*'''LOES''' - [[Laser optical emission spectroscopy]]
*'''LS''' - [[Raman scattering|Light (Raman) scattering]]
==M==
*'''MALDI''' - [[Matrix-assisted laser desorption/ionization]]
*'''MIT''' - [[Magnetic induction tomography]]
*'''MRFM''' - [[Magnetic resonance force microscopy]]
*'''MRI''' - [[Magnetic resonance imaging]]
*'''MS''' - [[Mass spectrometry]]
*'''MS/MS''' - [[Tandem mass spectrometry]]
*'''MEIS''' - [[Medium energy ion scattering]]
*'''Mössbauer spectroscopy''' - [[Mössbauer spectroscopy]]
*'''MTA''' - [[Microthermal analysis]]
==N==
*'''Nanovid microscopy''' - [[Nanovid microscopy]]
*'''ND''' - [[Neutron diffraction]]
*'''NDP''' - [[Neutron depth profiling]]
*'''NAA''' - [[Neutron activation analysis]]
*'''NEXAFS''' - [[NEXAFS|Near edge X-ray absorption fine structure]]
*'''NMR''' - [[NMR spectroscopy|Nuclear magnetic resonance spectroscopy]]
*'''NOESY''' - [[NOESY|Nuclear Overhauser effect spectroscopy]]
*'''NSOM''' - [[Near-field scanning optical microscope|Near-field optical microscope]]
==O==
*'''OES''' - [[Emission spectroscopy|Optical emission spectroscopy]]
*'''Osmometry''' - [[Osmometry]]
==P==
*'''PAS''' - [[Positron annihilation spectroscopy]]
*'''PAT''' or '''PACT''' - [[Photoacoustic tomography]] or photoacoustic computed tomography
*'''PAX''' - [[Photoemission of adsorbed xenon]]
*'''PC or PCS''' - [[Photocurrent spectroscopy]]
*'''PD''' - [[Photodesorption]]
*'''PDEIS''' - [[Potentiodynamic electrochemical impedance spectroscopy]]
*'''PED''' - [[Photoelectron diffraction]]
*'''Porosimetry''' - [[Porosimetry]]
*'''Phase contrast microscopy''' - [[Phase contrast microscopy]]
*'''PIXE''' - [[PIXE|Particle (or proton) induced X-ray spectroscopy]]
*'''Powder diffraction''' - [[Powder diffraction]]
*'''PTMS''' - [[Photothermal microspectroscopy]]
==Q==
*'''QENS''' - [[Quasi-elastic neutron scattering]]
==R==
*'''Raman''' - [[Raman spectroscopy]]
*'''RAXRS''' - [[Resonant anomalous X-ray scattering]]
*'''RBS''' - [[Rutherford backscattering|Rutherford backscattering spectroscopy]]
*'''REM''' - [[Reflection electron microscopy]]
*'''RHEED''' - [[RHEED|Reflection high energy electron diffraction]]
*'''RR spectroscopy''' - [[Resonance Raman spectroscopy]]
==S==
*'''SAM''' - [[Scanning Auger microscopy]]
*'''SANS''' - [[Small angle neutron scattering]]
*'''SAXS ''' - [[SAXS|Small angle X-ray scattering]]
*'''SCANIIR''' - [[Surface composition by analysis of neutral species and ion-impact radiation]]
*'''SE''' - [[Ellipsometry|Spectroscopic ellipsometry]]
*'''SEC''' - [[Size exclusion chromatography]]
*'''SEIRA''' - [[Surface enhanced infrared absorption spectroscopy]]
*'''SEM''' - [[Scanning electron microscope|Scanning electron microscopy]]
*'''SERS''' - [[Surface enhanced Raman spectroscopy]]
*'''SEXAFS''' - [[Surface extended X-ray absorption fine structure]]
*'''SICM''' - [[Scanning ion-conductance microscopy]]
*'''SIMS''' - [[Secondary ion mass spectrometry]]
*'''SNMS''' - [[Sputtered neutral species mass spectroscopy]]
*'''SNOM''' - [[Scanning near-field optical microscopy]]
*'''SPECT''' - [[Single photon emission computed tomography]]
*'''SPM''' - [[Scanning probe microscopy]]
*'''SRM-CE/MS''' - Selected-reaction-monitoring [[capillary electrophoresis|capillary-electrophoresis]] [[Liquid chromatography-mass spectrometry|mass-spectrometry]]
*'''SSNMR''' - [[Solid-state nuclear magnetic resonance]]
*'''Stark spectroscopy''' - [[Stark effect|Stark spectroscopy]]
*'''STEM''' - [[Scanning transmission electron microscopy]]
*'''STM''' - [[Scanning tunneling microscopy]]
==T==
*'''TEM''' - [[Transmission electron microscopy]]
*'''TAT''' or '''TACT''' - [[Thermoacoustic tomography]] or thermoacoustic computed tomography (see also [[photoacoustic tomography]] - PAT)
*'''TGA''' - [[Thermogravimetric analysis]]
*'''TIRFM''' - [[Total internal reflection fluorescence microscopy]]
*'''TMA''' - [[Thermomechanical analysis]]
*'''TXRF''' - Total reflection [[X-ray fluorescence]] analysis
*'''Two-photon excitation microscopy''' - [[Two-photon excitation microscopy]]
==U==
*'''Ultrasound attenuation spectroscopy''' - [[Ultrasound attenuation spectroscopy]]
*'''Ultrasonic testing''' - [[Ultrasonic testing]]
*'''UPS''' - [[Ultraviolet-visible spectroscopy|UV-photoelectron spectroscopy]]
==V==
*'''VEDIC''' - Video-enhanced [[differential interference contrast microscopy]]
*'''Voltammetry''' - [[Voltammetry]]
==W==
*'''WAXS ''' - [[Wide angle X-ray scattering]]
*'''WDXRF or WDS''' - [[Wavelength dispersive X-ray spectroscopy]]
==X==
*'''XAES''' - [[X-ray induced Auger electron spectroscopy]]
*'''XANES''' - [[XANES]], synonymous with [[Near edge X-ray absorption fine structure|NEXAFS (Near edge X-ray absorption fine structure)]]
*'''XAS''' - [[X-ray absorption spectroscopy]]
*'''X-CTR''' - [[X-ray crystal truncation rod]] scattering
*'''X-ray crystallography''' - [[X-ray crystallography]]
*'''XDS''' - [[X-ray diffuse scattering]]
*'''XPEEM''' - [[X-ray photoelectron emission microscopy]]
*'''XPS''' - [[X-ray photoelectron spectroscopy]]
*'''XR''' - [[X-ray reflectivity]]
*'''XRD''' - [[X-ray diffraction]]
*'''XRF''' - [[X-ray fluorescence]] analysis
*'''XSW''' - [[X-ray standing waves|X-ray standing wave]] technique
==References==
*{{cite book | author=Callister, WD | title=Materials Science and Engineering - An Introduction | publisher=''[[John Wiley and Sons]]'' : London | year=2000 | isbn=0-471-32013-7}}
*{{cite book | editor=Yao, N | title=Focused Ion Beam Systems: Basics and Applications | publisher=''[[Cambridge University Press]]'' : Cambridge, UK | year=2007 | isbn=978-052183-1994}}
[[Category:Materials science|Materials analysis methods]]
[[Category:Analytical chemistry]]
[[Category:Science-related lists|Materials analysis methods]]
[[Category:Topical indexes|Materials analysis methods]]
[[Category:Scientific techniques|Materials analysis methods]]
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