X-ray scattering techniques 156962 224766350 2008-07-10T09:31:39Z Tpikonen 121981 c [[Image:X-ray diffraction pattern 3clpro.jpg|thumb|250px|This is an X-ray diffraction pattern formed when X-rays are focused on a crystalline material, in this case a protein. Each dot, called a reflection, forms from the coherent interference of scattered X-rays passing through the crystal.]] '''X-ray scattering techniques''' are a family of non-destructive analytical [[scientific technique|techniques]] which reveal information about the [[crystallography|crystallographic]] structure, chemical composition, and physical properties of materials and thin films. These techniques are based on observing the [[scattering|scattered]] [[intensity]] of an [[x-ray]] beam hitting a sample as a function of incident and scattered angle, polarization, and wavelength or energy. ==X-ray diffraction techniques== X-ray diffraction finds the geometry or shape of a molecule using x-rays. X-ray [[diffraction]] techniques are based on the [[elastic collision|elastic]] scattering of x-rays from structures that have [[crystal|long range order]]. The most comprehensive description of scattering from crystals is given by the [[dynamical theory of diffraction]]. <ref>{{cite book|last=Azároff|first=L. V.| coauthors=R. Kaplow, N. Kato, R. J. Weiss, A. J. C. Wilson, R. A. Young|title=X-ray diffraction|year=1974|publisher=McGraw-Hill}}</ref> * [[X-ray Crystallography|Single-crystal X-ray diffraction]] is a technique used to solve the complete structure of crystalline materials, ranging from simple [[inorganic chemistry|inorganic solids]] to complex [[macromolecules]], such as [[proteins]]. * [[Powder diffraction]] (XRD) is a technique used to characterize the crystallographic structure, [[crystallite]] size (grain size), and preferred orientation in polycrystalline or powdered solid samples. Powder diffraction is commonly used to identify unknown substances, by comparing diffraction data against a database maintained by the [[International Centre for Diffraction Data]]. It may also be used to characterize heterogeneous solid mixtures to determine relative abundance of crystalline compounds and, when coupled with lattice refinement techniques, such as [[Rietveld refinement]], can provide structural information on unknown materials. Powder diffraction is also a common method for determining [[strain scanning|strains]] in crystalline materials. * Thin film diffraction and grazing incidence x-ray diffraction may be used to characterize the crystallographic structure and preferred orientation of substrate-anchored thin films. * [[High-resolution x-ray diffraction]] is used to characterize thickness, crystallographic structure, and strain in thin epitaxial films. It employs parallel-beam optics. * X-ray [[pole figure]] analysis enables one to analyze and determine the distribution of crystalline orientations within a crystalline thin-film sample. * X-ray rocking curve analysis is used to quantify grain size and mosaic spread in crystalline materials. ==Scattering techniques== ===Elastic scattering=== Materials that do not have long range order may also be studied by scattering methods that rely on [[elastic collision|elastic]] scattering of monochromatic x-rays. * [[Small angle X-ray scattering (SAXS)]] probes structure in the nanometer to micrometer range by measuring scattering intensity at scattering angles 2θ close to 0°. <ref>{{cite book|last = Glatter|first=O. |coauthors= O. Kratky|title=Small Angle X-ray Scattering|year=1982|publisher=Academic Press|url=http://physchem.kfunigraz.ac.at/sm/Software.htm}}</ref> * [[X-ray reflectivity]] is an analytical technique for determining thickness, roughness, and density of single layer and multilayer thin films. * [[Wide angle X-ray scattering]] (WAXS), a technique concentrating on scattering angles 2θ larger than 5°. ===Inelastic scattering=== When the energy and angle of the [[inelastic collision|inelastically]] scattered x-rays are monitored scattering techniques can be used to probe the [[electronic band structure]] of materials. * [[Compton scattering]] * Resonant inelastic x-ray scattering (RIXS) * [[X-ray Raman scattering]] ==Manufacturers of X-ray diffraction and scattering equipment== * [http://www.hecus.at Hecus X-Ray Systems] * [[Anton Paar]] * [[Bede X-ray Metrology]] * [[Bruker|Bruker AXS]] (formerly Siemens) * [http://www.incoatec.de Incoatec] * [http://www.inel.fr/en/accueil/ Inel] * [[inXitu]], Inc. * [[Jordan Valley Semiconductors]] * [http://www.marresearch.com Marresearch] * [[PANalytical]] (formerly Philips) * [http://www.mar-usa.com Rayonix] * [[Rigaku]] * [[Shimadzu]] * [[Thermo Fisher Scientific]] * [[Xenocs]] * [[XStream Systems]] ==References== <references/> == See also == * [[Structure determination]] * [[X-ray crystallography]] ==External links== {{commonscat|X-ray diffraction}} * [http://www.iucr.ac.uk/ International Union of Crystallography] ** [http://www.iucr.org/cww-top/crystal.index.html IUCr Crystallography Online] * [http://www.icdd.com/ The International Centre for Diffraction Data (ICDD)] * [http://www.jiscmail.ac.uk/lists/xrd.html Archives of XRD@JISCMAIL.AC.UK] * [http://bca.cryst.bbk.ac.uk/bca/welcome.htm The British Crystallographic Association] * [http://www.mrl.ucsb.edu/mrl/centralfacilities/xray/xray-basics/index.html Introduction to X-ray Diffraction] at [[University of California, Santa Barbara]] [[Category:X-rays]][[Category:Scattering]] [[Category:Diffraction]] [[Category:Scientific techniques]] {{chemistry-stub}} {{physics-stub}} [[cs:Rentgenová strukturní analýza]] [[de:Röntgenbeugung]] [[es:Cristalografía de rayos X]] [[fi:Röntgenkristallografia]] [[fr:Diffractométrie de rayons X]] [[it:Diffrazione dei raggi X]] [[ja:X線回折]] [[lv:Rentgendifraktometrija]] [[nl:Röntgendiffractie]] [[no:Røntgenkrystallografi]] [[pl:Rentgenografia strukturalna]] [[scn:Diffrazzioni dî raji X]] [[sv:Röntgenkristallografi]] [[zh:X光散射技术]]