X-ray scattering techniques
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2008-07-10T09:31:39Z
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[[Image:X-ray diffraction pattern 3clpro.jpg|thumb|250px|This is an X-ray diffraction pattern formed when X-rays are focused on a crystalline material, in this case a protein. Each dot, called a reflection, forms from the coherent interference of scattered X-rays passing through the crystal.]]
'''X-ray scattering techniques''' are a family of non-destructive analytical [[scientific technique|techniques]] which reveal information about the [[crystallography|crystallographic]] structure, chemical composition, and physical properties of materials and thin films. These techniques are based on observing the [[scattering|scattered]] [[intensity]] of an [[x-ray]] beam hitting a sample as a function of incident and scattered angle, polarization, and wavelength or energy.
==X-ray diffraction techniques==
X-ray diffraction finds the geometry or shape of a molecule using x-rays. X-ray [[diffraction]] techniques are based on the [[elastic collision|elastic]] scattering of x-rays from structures that have [[crystal|long range order]]. The most comprehensive description of scattering from crystals is given by the [[dynamical theory of diffraction]]. <ref>{{cite book|last=Azároff|first=L. V.| coauthors=R. Kaplow, N. Kato, R. J. Weiss, A. J. C. Wilson, R. A. Young|title=X-ray diffraction|year=1974|publisher=McGraw-Hill}}</ref>
* [[X-ray Crystallography|Single-crystal X-ray diffraction]] is a technique used to solve the complete structure of crystalline materials, ranging from simple [[inorganic chemistry|inorganic solids]] to complex [[macromolecules]], such as [[proteins]].
* [[Powder diffraction]] (XRD) is a technique used to characterize the crystallographic structure, [[crystallite]] size (grain size), and preferred orientation in polycrystalline or powdered solid samples. Powder diffraction is commonly used to identify unknown substances, by comparing diffraction data against a database maintained by the [[International Centre for Diffraction Data]]. It may also be used to characterize heterogeneous solid mixtures to determine relative abundance of crystalline compounds and, when coupled with lattice refinement techniques, such as [[Rietveld refinement]], can provide structural information on unknown materials. Powder diffraction is also a common method for determining [[strain scanning|strains]] in crystalline materials.
* Thin film diffraction and grazing incidence x-ray diffraction may be used to characterize the crystallographic structure and preferred orientation of substrate-anchored thin films.
* [[High-resolution x-ray diffraction]] is used to characterize thickness, crystallographic structure, and strain in thin epitaxial films. It employs parallel-beam optics.
* X-ray [[pole figure]] analysis enables one to analyze and determine the distribution of crystalline orientations within a crystalline thin-film sample.
* X-ray rocking curve analysis is used to quantify grain size and mosaic spread in crystalline materials.
==Scattering techniques==
===Elastic scattering===
Materials that do not have long range order may also be studied by scattering methods that rely on [[elastic collision|elastic]] scattering of monochromatic x-rays.
* [[Small angle X-ray scattering (SAXS)]] probes structure in the nanometer to micrometer range by measuring scattering intensity at scattering angles 2θ close to 0°. <ref>{{cite book|last = Glatter|first=O. |coauthors= O. Kratky|title=Small Angle X-ray Scattering|year=1982|publisher=Academic Press|url=http://physchem.kfunigraz.ac.at/sm/Software.htm}}</ref>
* [[X-ray reflectivity]] is an analytical technique for determining thickness, roughness, and density of single layer and multilayer thin films.
* [[Wide angle X-ray scattering]] (WAXS), a technique concentrating on scattering angles 2θ larger than 5°.
===Inelastic scattering===
When the energy and angle of the [[inelastic collision|inelastically]] scattered x-rays are monitored scattering techniques can be used to probe the [[electronic band structure]] of materials.
* [[Compton scattering]]
* Resonant inelastic x-ray scattering (RIXS)
* [[X-ray Raman scattering]]
==Manufacturers of X-ray diffraction and scattering equipment==
* [http://www.hecus.at Hecus X-Ray Systems]
* [[Anton Paar]]
* [[Bede X-ray Metrology]]
* [[Bruker|Bruker AXS]] (formerly Siemens)
* [http://www.incoatec.de Incoatec]
* [http://www.inel.fr/en/accueil/ Inel]
* [[inXitu]], Inc.
* [[Jordan Valley Semiconductors]]
* [http://www.marresearch.com Marresearch]
* [[PANalytical]] (formerly Philips)
* [http://www.mar-usa.com Rayonix]
* [[Rigaku]]
* [[Shimadzu]]
* [[Thermo Fisher Scientific]]
* [[Xenocs]]
* [[XStream Systems]]
==References==
<references/>
== See also ==
* [[Structure determination]]
* [[X-ray crystallography]]
==External links==
{{commonscat|X-ray diffraction}}
* [http://www.iucr.ac.uk/ International Union of Crystallography]
** [http://www.iucr.org/cww-top/crystal.index.html IUCr Crystallography Online]
* [http://www.icdd.com/ The International Centre for Diffraction Data (ICDD)]
* [http://www.jiscmail.ac.uk/lists/xrd.html Archives of XRD@JISCMAIL.AC.UK]
* [http://bca.cryst.bbk.ac.uk/bca/welcome.htm The British Crystallographic Association]
* [http://www.mrl.ucsb.edu/mrl/centralfacilities/xray/xray-basics/index.html Introduction to X-ray Diffraction] at [[University of California, Santa Barbara]]
[[Category:X-rays]][[Category:Scattering]] [[Category:Diffraction]]
[[Category:Scientific techniques]]
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